Publications
1. W. F. Egelhoff, Jr., J. W. Linnett and
D. L. Perry, "UPS Studies of the Adsorption and Decomposition of Methanol
and Formaldehyde on a Tungsten (100) Surface," J. Elect. Spectr. 5, 339 (1974).
2. W. F. Egelhoff, Jr., J. W. Linnett and D. L. Perry,
"Ultraviolet Photoemission Studies of CO, N2, and Carbon
Absorbed on W(100)," Fara. Disc. of the Chem.
Soc., No. 59, 34, 1974.
3. W. F. Egelhoff, Jr., "UPS of Atoms and Molecules
Adsorbed on W(100)," Ph.D. Thesis, January 1975.
4. W. F. Egelhoff, Jr. and D. L. Perry, "Angular
Dependence of the Photoelectron Spectra of Hydrogen Adsorbed on W(100)," Phys. Rev. Lett. 34, 93
(1975).
5. J. W. Linnett, D. L. Perry, and W. F. Egelhoff, Jr.,
"Identification of Localized and Delocalized Adsorbate Orbitals on W(100) by Photoelectron Spectroscopy," Chem. Phys.
Lett. 36, 331 (1975).
6. W. F. Egelhoff, Jr., J. W. Linnett and D. L. Perry,
"The Dependence of the Photoelectron Intensity from the Surface State
of W(100) on Photon Energy: Evidence for the p.A Mode of
Photoemission," Phys. Rev. Letters
36, 98, (1976).
7. W. F. Egelhoff, Jr., J. W. Linnett, and D. L. Perry,
"The Adsorption of Methanol, Formaldehyde, and Ammonia on W(100) Studied by Ultraviolet Photoelectron
Spectroscopy," Fara. Disc. of the Chem. Soc., 60,
127, (1976).
8. W. F. Egelhoff, Jr., J. W. Linnett, and D. L. Perry,
"The Adsorption
of Mercury on Tungsten (100) Studied by Ultraviolet Photoelectron
Spectroscopy," Surface Sci. 54, 670 (1976).
9. V. P. Ivanov, G. K. Boreskov, W. F. Egelhoff, Jr., and W.
H. Weinberg, "The Chemisorption of Oxygen on the Ir(111)
Surface," Surface Sci. 61, 28 (1976).
10. P. A. Zhdan, G. K. Boreskov, W. F. Egelhoff, Jr., and W.
H. Weinberg, "An XPS and UPS Investigation of the Chemisorption of CO on Ir(111)," Chem. Phys. Lett. 44, 528
(1976).
11. W. F. Egelhoff, Jr., W. H. Weinberg, P. A. Zhdan and G.
K. Boreskov, "An XPS Investigation of the Decomposition of NO on
Ir(111)," J. Catal. 45, 281 (1976).
12. P. A. Zhdan,, G. K. Boreskov,
W. F. Egelhoff, Jr. and W. H. Weinberg, "An XPS Investigation of the
Chemisorption of Oxygen on the Iridium (111) Surface," Surface Sci. 61,
207 (1976).
13. P. A. Zhdan, G. K. Boreskov, W. F. Egelhoff, Jr. and W.
H. Weinberg, "The Application of XPS to the Determination of the Reaction
Kinetics of the CO Oxidation Reaction on Ir(111),"
Surface Sci. 61, 377 (1976).
14. W. H. Weinberg, W. F. Egelhoff, Jr.
and S. P. Withrow, "The Dynamics of Oxygen Adsorption on Iridium
(111)," J. Vac. Sci. Technol. 14, 482 (1977).
15. V. P. Ivanov, V.
I. Savchenko, G. K. Boreskov, W. F. Egelhoff, Jr., and W. H. Weinberg,
"The Oxidation of CO on the Ir(111)
Surface," J. Catal. 48, 482 (1977).
16. P. A. Zhdan, G. K. Boreskov, A. I. Boronin, A. P.
Schepelin, W. F. Egelhoff, Jr. and W. H. Weinberg, "Carbon Monoxide
Oxidation by Nitric Oxide on Iridium(111) Studied by X-ray and UV Photoelectron
Spectroscopy," Appl. Surf. Sci. 1, 25 (1977).
17. W. F. Egelhoff, Jr. and T. P. Schreiber, "Auger
Analysis of Sulfur on Diesel Particulates," G. M. Res. Publications, March
1977.
18. W. F. Egelhoff, Jr., G. G. Tibbetts and J. M.
Burkstrand, "A Photoemission Study of a Sub-Monolayer Film of Copper on
the Basal Plane of Graphite," G. M. Res. Publications, March 1977.
19. V. P. Ivanov, G. K. Boreskov, V. I. Savchenko, V. L.
Taturov, W. F. Egelhoff, Jr. and W. H. Weinberg, "The Chemisorption and
Reaction of Oxygen and CO on Ir(111)," Kinetika i Kataliz (Russian) 18,
570 (1977).
20. V. P. Ivanov, G. K. Boreskov, V. I. Savchenko, W. F.
Egelhoff, Jr. and W. H. Weinberg, "A Study of the Chemisorption and
Reaction of Oxygen and CO on Ir(110)," Kinetika i Kataliz (Russian) 18,
575 (1977).
21. P. A. Zhdan, G. K. Boreskov, A. I. Boronin, W. F.
Egelhoff, Jr. and W. H. Weinberg, "X-ray and UV Photoemission Studies of
the Chemisorption of Carbon Monoxide, Oxygen, and Nitric Oxide on the (111)
Plane of Iridium," Kinetika i Kataliz (Russian) 18, 571 (1977).
22. W. H. Weinberg, W. F. Egelhoff, Jr., V. P. Ivanov, V. L.
Tataurov and G. K. Boreskov, "A Comparison of the Ir(111) and Ir(110)
Surfaces in the Adsorption and Reaction of Oxygen and Carbon Monoxide,"
Proc. 7th Int. Vac. Cong., North
Holland, Vienna, 1977, p. 1151.
23. G. G. Tibbetts and W. F. Egelhoff,
Jr., "A Quasiatomic Excitation in Bulk Nickel," Phys. Rev. Lett.
41, 188 (1978).
24. W. F. Egelhoff, Jr. and G. G. Tibbetts, "A
Photoelectron Study of Pd, Ni, and Cu Clusters on Carbon Surfaces," Solid
State Comm. 29, 53 (1979).
25. W. F. Egelhoff, Jr., "Freon (F-11 and F-12)
Disposal," G. M. Res. Publications, August 1978.
26. G. G.Tibbetts and W. F. Egelhoff, Jr.,
"The Growth of Thin Metal Films on Carbon," J. Vac. Sci. Technol. 16,
661 (1979).
27. W. F. Egelhoff, Jr. and G. G.
Tibbetts, "Growth of Copper, Nickel, and Palladium Films on Graphite and
Amorphous Carbon," Phys. Rev. B 19, 5028 (1979).
28. P. A. Zhdan, A. P. Schepelin, A. I. Boronin, G. K.
Boreskov, W. F. Egelhoff, Jr. and W. H. Weinberg, "Photoelectron
Spectroscopic Evidence for the Oxidation of Ir(111)," J. Catal. 62, 180 (1980).
29. W. F. Egelhoff, Jr. and S. C. Chang, "An Analysis
of a Tin Oxide NO Sensor," G. M. Res. Publications, August 1979.
30. P. A. Zhdan, G. K. Boreskov, A. I. Boronin, A. P.
Schepelin, W. F. Egelhoff, Jr. and W. H. Weinberg, "Nitric Oxide
Adsorption and Decomposition on the (111) and (110) Surfaces of Iridium,"
J. Catal. 60, 9399
(1979).
31. G. G Tibbetts. and W. F.
Egelhoff, Jr., "Thin Mixed Valent Films of Ytterbium Aluminum Alloy,"
J. Vac. Sci. Technol. 17, 458 (1980).
32. W. F. Egelhoff, Jr. and G. G. Tibbetts, "Valence Charges During Autoionization and Auger Emission in a Ytterbium
Aluminum Alloy," Phys. Rev. Lett. 44, 482 (1980).
33. W. F. Egelhoff, Jr., "A Photoconducting Sensor for
Exhaust Gases," G. M. Record of Invention, August 1979.
34. W. F. Egelhoff, Jr., "The Nitric Oxide
Reduction," in The Chemical Physics of Solids, Surfaces and Heterogeneous
Catalysis, D. P. Woodruff and D. A. King, Eds., Elsevier, London, 1982, p. 397.
(Invited review article).
35. W. F. Egelhoff, Jr., G. G. Tibbetts,
M. H. Hecht and I. Lindau, "Photoemission
Studies on Thulium," J. Vac. Sci. Technol. 18, 599 (1981).
36. W. F. Egelhoff, Jr., G. G. Tibbetts, M. H. Hecht and I. Lindau, "Determination of the Decay Channel of
the 4d 4f Resonance in Thulium," Phys. Rev. Lett. 46,
1071 (1981).
37. W. F. Egelhoff, Jr., "Thin Ag Films on Al(001)," Appl. of Surf. Sci. 11/12,
761 (1982).
38. W. F. Egelhoff, Jr. and G. G. Tibbetts,
"Photoemission Studies of a Mixed Valent Ytterbium-Aluminum Alloy,"
(extended abstract) VI International Conference on Vacuum Ultraviolet Radiation
Physics, Vol. 1, Charlottesville, (1980)
p. 20.
39. W. F. Egelhoff, Jr., "Electronic Structure
Evolution of Au, Ag, and Cu Deposited on Al(001),"
J. Vac. Sci. Technol. 20, 668 (1982).
40. W. F. Egelhoff, Jr., "Thermochemical Values for
CuNi Surface Segregation Deduced from Core-Level Binding-Energy Shifts,"
Phys. Rev. Lett. 50, 587 (1983).
41. W. F. Egelhoff, Jr.,
"Thermochemistry of Interface and Surface Segregation and Chemisorption
from Core Level Binding Energy Shifts," (extended abstract) J. Vac. Sci.
Technol. A l, 1102 (1983).
42. W. F. Egelhoff, Jr., "Surface Electronic Structure
and Screening of 3d-Band Holes in Cu(100)," Phys.
Rev. B 29, 4769 (1984).
43. W. F. Egelhoff, Jr., "A Core-Level
Binding-Energy-Shift Analysis of Adsorption and Desorption," Phys. Rev. B
29, 3681 (1984).
44. W. F. Egelhoff, Jr., "A Core-Level
Binding-Energy-Shift Analysis of N2 on Ni(100),"
(extended abstract) J. Vac. Sci. Technol. A 2, 1013 (1984).
45. W. F. Egelhoff, Jr., "Surface
Electronic Structure Changes Induced by Chemisorption," (extended
abstract) J. Vac. Sci. Technol. A 2, 932 (1984).
46. W. F. Egelhoff, Jr., "Growth
Morphology Determination in the Initial Stages of Epitaxy by XPS," J. Vac.
Sci. Technol. A 2, 350 (1984).
47. W. F. Egelhoff, Jr., "N2 on Ni(100): Angular Dependence of the N1s XPS Peaks,"
Surface Sci. 141, L324 (1984).
48. W. F. Egelhoff, Jr., "X-Ray Photoelectron and Auger
Electron Forward Scattering: A New Tool for Studying Epitaxial Growth and
Core-Level Binding Energy Shifts," Phys. Rev. B 30, 1052 (1984).
49. W. F. Egelhoff, Jr., "Angle-Resolved XPS of the
Epitaxial Growth of Cu on Ni(100)," in
Structure of Surfaces, (Proc. of the First International Conference on
the Structure of Solid Surfaces), M.A. Van Hove and S.Y. Tong, Eds, Springer,
Berlin, 1985, p. 199.
50. R. A. Armstrong. and W. F.
Egelhoff, Jr., "An Analysis of Angular Dependent XPS
Peak Intensities. Surface Sci. 154, L225 (1985).
51. W. F. Egelhoff, Jr., "The XPS Searchlight
Effect: A New Analytical Tool for
Layered Structures, Epitaxy, and Interfaces," Material Res. Soc. Symp. Proc. 37, 443 (1985).
52. W. F. Egelhoff, Jr., "A Core-Level
Binding-Energy Shift Analysis of CO, H, and O Adsorption on Cu-Ni
Surfaces," J. Vac. Sci. Technol. A 3, 1305
(1985).
53. W. F. Egelhoff, Jr., "A New Tool for Studying
Epitaxy and Interfaces: The XPS
Searchlight Effect," J. Vac. Sci. Technol. A 3, 1511
(1985).
54. W. F. Egelhoff, Jr., " Summary Abstract: X-Ray
Photoelectron and Auger Electron Forward Scattering: A Structural Probe for Studying Ultra-Thin
Epitaxial Films and Interfaces," J. Vac. Sci. Technol. A
4, 758 (1986).
55. W. F. Egelhoff, Jr., "Core-Level Binding-Energy
Shifts in Solids and at Surfaces," Surface Science Reports 6, 253 (1987).
(Invited review article)
56. W. F. Egelhoff, Jr., "XPS and
Auger Forward Scattering in Epitaxial Films," Physics News Section of
Physics Today January 1987, p. S-69. (Invited news article)
57. W. F. Egelhoff, Jr., "Summary Abstract: The Importance of Multiple Scattering in XPS
and Auger Electron Diffraction in Crystals,"
J. Vac. Sci. Technol. A 5, 1684 (1987).
58. W. F. Egelhoff, Jr., "Summary Abstract: Heats of Adsorption of Atomic C, N, and O on Ni(100) and Cu(100) from a (Z+1) Core-Level Shift
Analysis," J. Vac. Sci. Technol. A 5, 700 (1987).
59. W. F. Egelhoff, Jr., "Structural Characterization
of Thin Metal Overlayers by X-Ray Photoelectron and Auger Electron Forward
Scattering," Mat. Res. Soc. Proceedings 83, 189 (1987).
60. W. F. Egelhoff, Jr., "The Role of
Multiple Scattering in XPS and Auger Electron Diffraction in Crystals," Phys. Rev. Lett. 59, 559 (1987).
61. W. F. Egelhoff, Jr., "UHV Leak
Sealing with a Silicon Resin Product," J. Vac. Sci. Technol., A 6, 2584,
(1988).
62. D. A. Steigerwald. and W. F.
Egelhoff, Jr., "Epitaxial fcc-Fe Films on Cu(100)," Phys. Rev. Lett. 60, 2558 (1988).
63. D. A. Steigerwald and Egelhoff, Jr., W. F.,
"Observation of Intensity Oscillations in RHEED During the Epitaxial
Growth of Cu and fcc Fe on Cu(100)," Surface Sci.
192, L887 (1987).
64. D. A. Steigerwald and W. F. Egelhoff, Jr., "Two
Simple, Metal Vapor Deposition Sources for a Downward Evaporation in Ultra-High
Vacuum," J. Vac. Sci. Technol. A 6, 3123 (1989). (Won the J.V.S.T. Shop Note Award)
65. D. A. Steigerwald and W. F. Egelhoff, Jr., "Growth
of Ultrathin Fe Films on Cu(100): Mechanisms, Morphology and Stability,"
(extended abstract) J. Vac. Sci. Technol. A 6, 1995 (1988).
66. W. F. Egelhoff, Jr., D. A. Steigerwald, J. E. Rowe, and T. D. Bussing,
"Short-Range Order in Submonolayer Ni on GaAs(110) by XPS Forward
Scattering," J. Vac. Sci. Technol. A 6, 1495 (1988).
67. J. R. Dutcher, B.
Heinrich, J. F. Cochran, D. A. Steigerwald, and W. F. Egelhoff, Jr.,
"Magnetic Properties of Sandwiches and Superlattices of fcc- Fe(001) Grown
on Cu(001) Substrates," J. Appl. Phys. 63, 3464 (1988).
68. B. Heinrich, K. B. Urquhart, J. R. Dutcher, J. F. Cochran, A. S. Arrott, D. A.
Steigerwald, and W. F. Egelhoff, Jr., "Large Surface Anisotropies in
Ultrathin Films of bcc and fcc Fe(001)," J. Appl. Phys. 63, 3863 (1988).
69. W. F. Egelhoff, Jr., "XPS Forward Scattering
Studies of Epitaxial Overlayers and Sandwich
Structures of Au and Ag on Ni(100)," J. Vac. Sci.
Technol. A 6, 730 (1988).
70. D. A. Steigerwald and W. F. Egelhoff, Jr.,
"Structural Study of the Epitaxial Growth of fcc-Fe Films, Sandwiches, and
Superlattices on Cu(100)," Surface Sci., 202,
472, (1988).
71. W. F. Egelhoff, Jr. and D.A.
Steigerwald, "The Role of Adsorbed Gases in Metal on Metal Epitaxy,"
J. Vac. Sci. Technol. A 7, 2167 (1989).
72. W. F. Egelhoff, Jr. and I. Jacob,
"RHEED Oscillations at 77 K," Phys. Rev. Lett. 62, 621 (1988).
73. W. F. Egelhoff, Jr., "X-Ray Photoelectron Forward
Scattering Studies of Surface Segregation in Epitaxial Ni-Cu-Ni(100)
Sandwich Structures," J. Vac. Sci.
Technol. A 7, 2060 (1989).
74. J. R. Dutcher, J. F. Cochran, I.
Jacob, and W. F. Egelhoff, Jr., "Brillouin Light Scattering Intensities
for Thin Magnetic Films with Large Perpendicular Ansoiotropies," Phys Rev.
B 39, 10430 (1989).
75. W.
Schwarzacher, W. Allison, R. F. Willis, J. Penfold, R. C Ward, W. F. Egelhoff, Jr., "Variation in
Magnetic Properties of Cu/fcc-Fe/Cu(001) Sandwich
Structures," Solid
State Commun. 71, 563 (1989).
76. B. Heinrich, J. F. Cochran, A. S. Arrott, S. T. Purcell,
K. B. Urquhart, J. R. Dutcher, and W. F. Egelhoff, Jr., "Development of
Magnetic Anisotropies in Ultrathin Epitaxial Films of Fe(001) and
Ni(001)," Applied Physics A 49, 473 (1989). (Invited review article)
77. W. F. Egelhoff, Jr., "X-Ray Photoelectron and Auger
Electron Forward Scattering: A New Tool
for Surface Crystallography," CRC Critical Reviews in Solid State
and Materials Science 16, 213 (1990).
(Invited review article)
78. W. F. Egelhoff, Jr., I. Jacob, J. M. Rudd, J. F.
Cochran, and B. Heinrich, "XPS and Auger Forward Scattering Studies of
Lattice Expansions and Contractions in Epitaxial Films," J. Vac. Sci.
Technol. A8, 1582 (1990).
79. W. F. Egelhoff, Jr., J. W. Gadzuk, C. J. Powell, and M.
A. Van Hove, "Auger Electron Angular Distributions: Forward Focusing or
Silhouettes?" (letter to the editor) Science 248, 1129 (1990).
80. W. R. Bennett, W. Schwarzacher,
and W. F. Egelhoff, Jr., "Concurrent Oscillations in Kerr Rotation and
Antiferromagnetic Coupling in Epitaxial Fe/Cu/Fe Structures," Phys. Rev.
Lett. 65, 3169 (1990).
81. J. F. Cochran, W. B. Muir, J. M. Rudd, B. Heinrich, Z.
Celinski, T.-T. LeTran, W. Schwarzacher, W. R. Bennett, and W. F. Egelhoff,
Jr., "Magnetic Anisotropy in Ultrathin fcc-Fe Films Grown on Cu(100)," J. Appl. Phys. 69, 5206 (1991).
82. W. F. Egelhoff, Jr., "XPS and Auger
Forward-Scattering Studies of the Epitaxial Growth of Fe on Ag(100)," Mat. Res. Soc. Symp. Proc.
229, 27 (1991).
(Invited paper, based on invited talk)
83. W. F. Egelhoff, Jr. and M. T. Kief,
"Antiferromagnetic Exchange Coupling in Co/Cu/Co and Fe/Cu/Fe Multilayers
on Cu(111)," Phys. Rev. B 45, 7795 (1992).
84. W. F. Egelhoff, Jr. and M. T. Kief, " Co/Cu/Co and
Fe/Cu/Fe Multilayers on Cu(111): The Absence of
Antiferromagnetic Exchange Coupling," IEEE Trans. Mag. 28, 2742 (1992).
85. "XPS Forward Scattering Studies of Fe on Ag(100):
Evidence for Exchange Diffusion at 100 K," (extended abstract) W. F.
Egelhoff, Jr., in DoE Workshop on Surface Diffusion and the Growth of
Materials, P. J. Feibelman, G. L.
Kellogg, and T. A. Michalske, Eds., Sandia Nat. Labs., Santa Fe, 1992.
86. "Magnetic Anisotropy in Ultrathin fcc-Fe (001)
Films Grown on Cu(100) Substrates," J. F.
Cochran, W. B. Muir, J. M. Rudd, M. From, B. Heinrich, W. R. Bennett, W.
Schwarzacher, and W. F. Egelhoff, Jr., Phys. Rev. B 45, 4676 (1992).
87. "Growth and Structure of Fe and Co Thin Films on Cu(111), Cu(100), and Cu(110): A Comprehensive Study of
Metastable Film Growth," M. T. Kief and W. F. Egelhoff, Jr., Phys. Rev. B
47, 10785 (1993).
88. "Perpendicular Magnetic Anisotropy in Epitaxial
Ultrathin Films of Fe and Co on Cu(100), Cu(110), and
Cu(111)," M. T. Kief and W. F. Egelhoff, Jr., J. Appl. Phys. 73, 6195
(1993).
89. "Face-Centered-Cubic(111)
to Body-Centered Cubic (110) Transion in Epitaxial Fe on Cu(111)," M. T.
Kief and W. F. Egelhoff, Jr., J. Vac. Sci. Technol. A
11, 1661 (1993).
90. "Spot-Profile Analyzing LEED Study of the Epitaxial
Growth of Fe, Co, and Cu on Cu(100)." G. L. Nyberg, M. T. Kief and W. F. Egelhoff, Jr., Phys. Rev. B 48,
14509 (1993).
91. "Semiclassical Explanation of the Generalized
Ramsauer-Townsend Minima in Electron-Atom Scattering," W. F. Egelhoff,
Jr., Phys. Rev. Lett. 71, 2883 (1993).
92. "Perpendicular Magnetic Anisotropy in Epitaxial
Ultrathin Films of Fe and Co on Cu(100), Cu(110), and
Cu(111)," M. T. Kief and W. F. Egelhoff, Jr., J. Appl. Phys., 73, 6195
(1993).
.
93. "Magnetic Properties of Epitaxial 6 ML fcc-Fe/Cu(100) Films," L. J. Swartendruber, L. H. Bennett, M.
T. Kief and W. F. Egelhoff, Jr., Mat. Res. Soc. Symp. Proc.,
313, 237 (1994).
94. "XPS and
Auger Forward Scattering: A Structural Diagnostic for Epitaxial Thin
Films," W. F. Egelhoff, Jr., pp. 220-304 in Thin Film Magnetism, B. Heinrich and J.A.C.
Bland, Eds., Springer-Verlag, Heidelberg, 1994.
(Invited review article)
95. "Magnetoresistance Values exceeding 21% in
Symmetric Spin Valves," W. F. Egelhoff, Jr., T. Ha, R.D.K. Misra, Y.
Kadmon, J. Nir, C. J. Powell, M. D. Stiles, R. D. McMichael, C.-L. Lin, J. M.
Sivertsen, J. H. Judy, K. Takano, A. E. Berkowitz, T.C. Anthony, and J. A.
Brug, J. Appl. Phys., 78, 273 (1995).
96. "Improved
Thermal Stability of GMR Spin Valve Films," R. D. McMichael, W. F.
Egelhoff, Jr., and M. Ha, a Proc. Mat. Res. Soc. Symp., Vol.
384, 397 (1995).
97. "An STM
Study of GMR Spin Valves" R.D.K. Misra, T. Ha, Y. Kadmon, C. J. Powell, M.
D. Stiles, R. D. McMichael, W. F. Egelhoff, Jr., C.-L. Lin,
J. M. Sivertsen, and J. H. Judy, Proc. Mat. Res. Soc.
Symp., Vol. 384, 373 (1995).
98. "Thermal
Degredation of Exchange Biased Films in Spin-Valves," R. D. McMichael, W.
F. Egelhoff, Jr., and L. H. Bennett , IEEE Trans. Mag. 31, 3930 (1995).
99. "Growth of
GMR Spin Valves Using Indium as a Surfactant," W. F. Egelhoff, Jr., P. J.
Chen, C. J. Powell, M. D. Stiles, and R.
D. McMichael, J. Appl. Phys. 79, 2491 (1996).
100. "Optimizing
the GMR of Symmetric and Bottom Spin Valves," W. F. Egelhoff, Jr., P. J.
Chen, C. J. Powell, M. D. Stiles, R. D. McMichael, C.-L. Lin, J. M. Sivertsen,
J. H. Judy, K. Takano, A. E. Berkowitz, T.C. Anthony, and J. A. Brug, J. Appl.
Phys. 79, 5277 (1996).
101. "Low
Temperature Growth of GMR Spin Valves," W. F. Egelhoff, Jr., T. Ha, R.D.K.
Misra, C. J. Powell, M. D. Stiles, R. D. McMichael, C.-L. Lin, J. M. Sivertsen,and J. H. Judy, J.
Appl. Phys. 79, 282 (1996)
102. "The Trade-Off between Large GMR and Small
Coercivity in Symmetric Spin Valves," W. F. Egelhoff, Jr., P. J. Chen, C.
J. Powell, M. D. Stiles, R. D. McMichael, C.-L. Lin, J. M. Sivertsen, J. H.
Judy, K. Takano, and A. E. Berkowitz, J. Appl. Phys. 79, 8603 (1996).
103. "Growth of GMR Spin Valves using Pb and Au as a
Surfactant," W. F. Egelhoff, Jr., P. J. Chen, C. J. Powell, M. D. Stiles,
R. D. McMichael, C.-L. Lin, J. M. Sivertsen, J. H. Judy, K. Takano,and A. E. Berkowitz, J. Appl. Phys., 80, 5183
(1996).
104. "Origins of Coercivity Increase in Annealed
Symmetric Spin Valves," R. D. McMichael, T. Watanabe, J. A. Dura, J. A.
Borchers, P. J. Chen, H.J. Brown, and W. F. Egelhoff, Jr., IEEE Trans. Mag.,
32, 4636 (1996).
105. "Magneto-optical Indicator Film Study of the
Magnetization of a Symmetric Spin Valve," V. I. Nikitenko, V. S. Gornakov,
L. M. Dedukh, Yu. P. Kabanov, A. F. Khapikov, L. H. Bennett, P. J. Chen, R. D.
McMichael, M. J. Donahue, L. J. Swartzendruber, A. J. Shapiro, H. J. Brown, and
W. F. Egelhoff, Jr., IEEE Trans. Mag., 32, 4639 (1996).
106. "Experimental Study of Magnetization Reversal
Process in a Non-symmetric Spin Valve," V. S. Gornakov, V. I. Nikitenko,
L. H. Bennett, H. J. Brown, M. J.
Donahue, W. F. Egelhoff, Jr., R. D. McMichael, and A. J. Shapiro, J. Appl. Phys. 81, 5215 (1997).
107. "MR in Symmetric Spin-Valves: Nanostructure and
Domain Dynamics," H. D. Chopra, B. J. Hockey, L. J. Swartzendruber, S. Z.
Hua, P. J. Chen, K. Raj, D. S. Lashmore, M. Wuttig, W. F. Egelhoff, Jr.,
Nanostructured Mat. 9, 451 (1997).
108. "Anomalous Properties of Spin Valves at Elevated
Temperatures," R. D. McMichael, P. J. Chen, and W. F. Egelhoff, Jr., IEEE
Trans. Mag. 33, 3589 (1997).
109. "Magnetic Domains in Multilayers, Single Films,
and Nanocomposites," H. D. Chopra, S. Z. Hua, D. S. Lashmore, M. Wuttig,
R. D. Shull, W. F. Egelhoff, Jr., and L. J. Swartzendruber, Micro. Anal. 28, 15 (1998).
110. "Specular Electron Scattering in Giant
Magnetoresistance Spin Valves," W. F. Egelhoff, Jr., P. J. Chen, C. J.
Powell, M. D. Stiles, R. D. McMichael, J. H. Judy, K. Takano, A. E. Berkowitz,
and J. M. Daughton, IEEE Trans. Mag. 33, 3580 (1998).
111. "Nanostructural Considerations in Giant
Magnetoresistive Co-Cu-based Symmetric Spin Valves," H. D. Chopra, B. J.
Hockey, P. J. Chen, W. F. Egelhoff, Jr., M. Wuttig, and S. Z Hua, Phys. Rev. B
55, 8390 (1997).
112. "
Observation of Domain Dynamics in GMR Co-Cu-based Polycrystalline
Multilayer," S. Z. Hua, D. S. Lashmore, L. J. Swartzendruber, W. F.
Egelhoff, Jr., K. Raj, and H. D. Chopra, J. Appl. Phys.81, 4582 (1997)
113. "Nanostructure, Interfaces, and Magnetic
Properties in Giant Magnetoresistance NiO-Co-Cu-based Spin Valves," H. D.
Chopra, B. J. Hockey, P. J. Chen, R. D. McMichael, and W. F. Egelhoff, Jr., J.
Appl. Phys. 81, 4017 (1997).
114. "Oxygen as a Surfactant in the Growth of GMR Spin
Valves," W. F. Egelhoff, Jr., P. J.
Chen, C. J. Powell, M. D. Stiles, R. D. McMichael, J. H. Judy, K.
Takano,and A. E. Berkowitz, J. Appl.
Phys., 82, 6142 (1997)
115. "Magnetic
Domains in Multilayers, Single Films, and Nanocomposites," H. D. Chopra,
S. Z. Hua, D. S. Lashmore, M. Wuttig, R. D. Shull, W. F. Egelhoff, Jr., and L.
J. Swartzendruber, Amer. Micro. Anal. 28, 27 (1998).
116. "Fluorine as a Surfactant in the Deposition of a
Monolayer of Fe on Cu(100)," W. F. Egelhoff, Jr.,
Surface Sci., 402-404, 32 (1998).
117.
"Ferromagnetic Resonance Linewidth in thin fims coupled to
NiO," R. D. McMichael, P. J. Chen, M. D. Stiles, and W. F. Egelhoff, Jr.,
J. Appl. Phys. 83, 7073 (1998).
118. "Time and
Tempearature Dependence of High Thermal Stability in NiO\Co\Cu\Co\M Spin
Valves," R. D. McMichael, P. J. Chen, and W. F. Egelhoff, Jr., IEEE Trans. Mag,
34, 897 (1998).
119. "Nature of
Coupling and Origin of Coercivity in Giant Magnetoresistance NiO-Co-Cu-based
Spin Valves," H. D. Chopra, D. X. Yang, P. J. Chen, D. C. Parks, and W. F.
Egelhoff, Jr., Phys Rev. B 61, 9642 (2000).
120. "Optimizing GMR Spin Valves: The Outlook for
Improved Properties ",W. F. Egelhoff, Jr., P. J. Chen, C. J. Powell, D.
Parks, R. D. McMichael, J. H. Judy, . Martien, A. E. Berkowitz, and J. M.
Daughton, Proc. 1998 International Nonvolatile Memory Technology Conference,
IEEE Publications, p. 34, Piscataway, NJ, 1998.
122. "Magneto-Optical Measurements of Ultrathin
Co-Pt(111) Multilayers," R. A. Fry, L. H. Bennett, E. Della Torre, R. D.
Shull, W. F. Egelhoff, Jr., R.F.C. Farrow and C. H. Lee, J. Mag. Mag. Mat. 193, 162 (1999).
123. "Surface Effects in the Growth of GMR Spin
Valves", W. F. Egelhoff, Jr., P. J. Chen, C. J. Powell, D. Parks, R. D.
McMichael, J. H. Judy, D. Mariten, A. E. Berkowitz, and J. M. Daughton, MRS
Symp. Proc. 517, 289 (1999).
124.
"Ferromagnetic resonance studies of NiO-coupled thin films of
Ni80Fe20", R. D. McMichael, M. D. Stiles, P. J. Chen, and W. F. Egelhoff, Jr., Phys. Rev.
B. 58, 8605 (1998).
125. "Specular
Electron Scattering in Metallic Thin Films" W. F. Egelhoff, Jr., P. J.
Chen, C. J. Powell, D. Parks, G. Serpa, R. D. McMichael, D. Mariten and A. E.
Berkowitz, Proc. 26th Conf. on the Physics and Chemistry of Semiconductor Interfaces,
J. Vac. Sci. Technol. B 17, 1702 (1999).
126. "Nature
of Magnetization reversal in exchange coupled NiO-Co bilayers," by H. D.
Chopra, David X. Yang, P. J. Chen, H. J. Brown, L. J. Swartzendruber, and W. F.
Egelhoff, Jr., Phys. Rev. B. 61, 15312 (2000).
127. "Contributions to Switching Field in NiO-Co-based
Spin Valves," by H. D. Chopra, D. X. Yang, P. J. Chen, and W. F. Egelhoff,
Jr., J. Appl. Phys. 87, 6986 (2000).
129.
"Atomically engineered growth of spin valves using
surfactants," H. D. Chopra, D. X. Yang, P. J. Chen, W. F. Egelhoff, Jr.,
Submitted to Science
130."Magnetization reversal in polycrystalline exchange
coupled NiO-Co bilayers," by H. D. Chopra, D. X. Yang, P. J. Chen, H. J.
Brown, L. J. Swartzendruber, and W. F. Egelhoff, Jr., J. Appl. Phys. 87, 4942
(2000)
131. "Exchange bias relaxation in CoO Biased
Films," R. D. McMichael, C. G. Lee, M. D. Stiles, P. J. Chen, F. G. Serpa,
and W. F. Egelhoff,
Jr., J. Appl. Phys 87, 6406 (2000).
132.
"Magnetization Ripple in Exchange Biased Thin Films," R. D.
McMichael, P. J. Chen, and W. F. Egelhoff, Jr., to be submitted to J. Appl.
Phys.
133. "Grazing Incidence X-ray Reflectometry (GIXR)
studies of Si/SiO2
/(Fex/Al)x10 multilayers", F.G. Serpa, M.Gomez, W.F. Egelhoff, Jr., J.
Slaughter, Submitted to J. Appl. Phys.
134. "Grazing Incidence X-ray Reflectometry studies of Au deposited in Si and
SiO2", F.G.Serpa, J.Pedulla, P.Chen, W.F.Egelhoff, Jr., Submitted to J. Appl. Phys.
135. "Study of
surface oxidation as a diffusion barrier for Al deposited on ferromagnetic
metals using grazing incidence x-ray reflectometry," W. F. Egelhoff Jr.,
P. J. Chen, R. D. McMichael, C. J. Powell, R. D. Deslattes, F. G. Serpa, R. D.
Gomez, J. Appl. Phys. 89, 5209 (2001).
136. "The
Dependence of Exchange Coupling on the Surface Roughness and Structure in -Fe2O3 and NiFe/ -Fe2O3 Bi-layers" S.
Bae, J. H. Judy, W. F. Egelhoff, Jr., and P. J. Chen, J. Appl. Phys. 87, 6650
(2000).
137. "Bottom GMR
Spin Valves Using a RF Reactive Bias Sputtered
-Fe2O3 Antiferromagnetic Layer," S. Bae, J. H. Judy, W. F.
Egelhoff, Jr, and P. J. Chen, J. Appl. Phys. 87, 6980 (2000).
138. "Effects of Annealing
on the GMR of Co-Cu-based Spin Valves," M. A. Mangan, G. Spanos, R. D.
McMichael, P. J. Chen, and W. F. Egelhoff, Jr., Metallurgical and Materials
Trans. A, v. 32A, pp. 577-584 (2001).
139. "Carbon,
A Bane of Giant Magnetoresistance Magnetic Multilayers," D. X. Yang, H. D.
Chopra, B. Shashishekar,P. J. Chen, and W. F. Egelhoff, Jr., Appl. Phys. Lett. 80, 2943 (2002).
140. "Interfacial Roughness Effects on Interlayer
Coupling in Spin Valves Grown on Different Seed Layers," D. C. Parks, P. J. Chen, W. F. Egelhoff, Jr., R. D. Gomez, J. Appl.
Phys. 87, 3023 (2000).
141. "Effects of Deposition Process Parameters on Exchange
Coupling of a-Fe2O3/NiFe Bi-layers and GMR in a-Fe2O3/NiFe/Cu/NiFe Spin
Valves," Seongtae Bae, W. F. Egelhoff, Jr., P. J. Chen, and Jack H. Judy.,
IEEE Trans. Mag. 36, 2892 (2000)
142. "The
Structural and Microscopic Analyses of a-Fe2O3/Co(NiFe)/Cu/Co(NiFe) Bottom GMR
Spin Valves," Seongtae Bae, W. F.
Egelhoff Jr., P. J. Chen, and Jack H. Judy,
IEEE Trans. Mag. 36, 2617 (2000)
143. "Large Anisotropy Induced by Oblique sputtering of
Ta Underlayers," R. D. McMichael, C. G. Lee, P. J. Chen, W. W. Miller, and
W. F. Egelhoff, Jr., J. Appl. Phys. 88, 5296 (2000).
144. "Hot
Electron Attenuation Lengths in Ultrathin Magnetic Thin Films" R. P. Lu,
B.A. Morgan, K. L. Kavanagh, C. J. Powell, P. J. Chen, F. G. Serpa, and W. F.
Egelhoff, Jr., J. Appl. Phys. 87, 5164 (2000).
145.
"Interfacial Scattering of Hot Electron in Ultrathin Au/Co
Films" R. P. Lu, B.A. Morgan, K. L. Kavanagh, C. J. Powell, P. J. Chen, F.
G. Serpa, and W. F. Egelhoff, Jr., J. Vac. Sci. Technol. B 18, 2047
(2000). (PCSI-27 Conf.)
146. "Magnetic behavior of Atomically Engineered
NiO-Co-Cu-based Giant Magnetoresistance Spin Valves Using Pb as a Surface
Modifier," H. D. Chopra, E. J. Pepetski, H. J. Brown, P. J. Chen, L. J.
Swartzendruber, and W. F. Egelhoff, Jr. Acta Materialia 48, 3501 (2000).
147. "Application of a-Fe2O3 bottom GMR
spin-valves for Magnetoresistive Random Access Memory (MRAM)," S. Bae, J.
H. Judy, P. J. Chen, W. F. Egelhoff, Jr., Z. Shayne, L. Sheppard, and E. J.
Torok, Jpn. Metl. of
Soc., 8, 1111-1113 (2001)
148. "Fabrication and
Chemical Stability of Magnetoresistive Random Access Memory (MRAM) Cell Using
an a-Fe2O3 Bottom Spin-Valves," S. Bae, S. Zurn, W. F. Egelhoff Jr., P. J.
Chen, L. Sheppard, E. J. Torok, and J.
H. Judy, IEEE Trans. Magn., 37, 3960, (2001)
149. "Surface and Interface Effects in the Growth of
Giant Magnetoresistance Spin Valves for Ultrahigh-Density Data-Storage
Applications." W. F. Egelhoff, Jr., P. J. Chen, C. J. Powell, and R. D.
McMichael, Proceedings of the 20th
International Seminar on Surface Physics, To be published by Progress in
Surface Science, 2000.
150. "Exchange anisotropy in NiFe films on (100) NiO
single-crystal substrate,"
S.M. Rezende, M.A. Lucena, A. Azevedo, A.B. Oliveira, F.M.
de Aguiar, and W.F. Egelhoff, Jr, Journal of Magnetism and Magnetic Materials
226-230, 1683-1685 (2001).
151. "Spin-glass and random-field effects in
exchanged-biased NiFe film on a NiO single-crystal substrate," A. E. P.
Araújo, F.L.A. Machado, A.R. Rodrigues, A. Azevedo, F.M. de Aguiar, J.R.L. de
Almeida, S.M. Rezende, and W. F. Egelhoff, Jr., J. Appl. Phys. 91, 7754 (2002).
152. "Magnetoelectronic Devices using a-Fe2O3 Bottom
GMR Spin Valves," S. Bae, S. Zurn, W. F. Egelhoff, Jr., P. J. Chen, L. Sheppard, E. J. Torok,
and J. H. Judy, 37, 1986 (2001).
153. "High Thermal Stability of Exchange-Biased
Bilayers and Bottom Ginat Magnetoresistive Spin Valve Using a-Fe2O3
Antiferromagnetic Layer," S. Bae, J. H. Judy, P. J. Chen, W. F. Egelhoff, Jr., and S. Zurn, Appl. Phys. Lett., 78, 4163 (2001).
154. “Surfactant Assisted Atomic Level Engineering of Spin
Valves.” H. D. Chopra, D. X. Yang, P. J. Chen, and W. F. Egelhoff, Jr., Phys.
Rev. B 65, 094433 (2002).
155. “Pinhole Coupling Strength In Giant Magnetoresistance
Spin Valves: A Statistical Approach,” D. X. Yang, E. J. Repetski, H. D. Chopra,
B. J. Spencer, D. C. Parks, P. J. Chen,
and W. F. Egelhoff, Jr.,
156. " Thermal Stability of Ta-pinned Spin Valves
," R. A. Fry, R. D. McMichael, J.
E. Bonevich, P.J. Chen, W. F. Egelhoff, Jr., C.-G. Lee, J. Appl. Phys. 89, 6825
(2001)
157. "Atomic Engineering of Spin Valves Using Ag as a
Surfactant ," D. X. Wang, B. Shashishekar, H. D. Chopra, P. J. Chen, W. F.
Egelhoff, Jr., Appl. Phys.Lett. 89, 7121 (2001)
158. "Strong Anisotropy in Thin Magnetic Films
Deposited on Obliquely Sputtered Ta Underlayers," R. D. McMichael, C. G.
Lee, P. J. Chen, W. W. Miller, and W. F. Egelhoff, Jr., J. Appl. Phys. 88, 3561
(2000).
159."Features of Domain Nucleation and Growth in
Co/Ru/Co Synthetic Antiferromagnets Deposited on Obliquely Sputtered Ta
Underlayers," A.J. Shapiro, V.S. Gornakov, V.I. Nikitenko, R.D. McMichael,
W.F. Egelhoff, Jr., Y. W. Tahk, R. D. Shull, L. Gan, J. Mag. Magn. Mat. 240, 70 (2002).
160. "Detection of Pinholes in Ultrathin Films by Magnetic
Coupling," W. F. Egelhoff, Jr., L. Gan, P. J. Chen, C. J. Powell, R. D.
McMichael, R. A. Fry, and G. Beach, D.
Martien, and A. E. Berkowitz, MRS Res. Soc. Symp. Proc. Vol.
674, T1.2.1 (2001).
161. "Applications of Ferromagnetic and Optical Materials,
Storage, and Magnetoelectronics," MRS Symposium Proceedings, Vol. 674, H.
J. Borg, K. Bussman, W. F. Egelhoff, Jr, L. Hesselink, S. A. Majetich, E. S.
Murdock, B. J. H. Stadler, M. Vasquez, M. Wuttig, J. Q. Xaio, Editors,
Materials Res. Society Press, Pittsburgh, in press.
162. "Ballistic
Magnetoresistance in a Nanocontact between a Ni Cluster and a Magnetic Thin
Film," M. Muñoz, , G.G. Qian, N. Karar, H. Cheng, I.G. Saveliev, N.
García, T. P. Moffat, P. J. Chen, L. Gan, and W. F. Egelhoff, Jr., Appl. Phys.
Lett 79, 2946 (2001).
163. " Effects of Ar Gas Cluster Ion Beam (GCIB)
Processing on Surface Roughness,Crystalline Orientation Texture, Magnetic, and
Giant Magnetoresistance (GMR) Properties of Reactively RF Sputtered a-Fe2O3 Bottom GMR Spin Valves ," S. Bae, J. H. Judy, P. J. Chen, L. Gan, W. F.
Egelhoff Jr., J. Hautala, D. B. Fenner, IEEE Trans. Mag.
164. "Effects of Sputtering Angle on Surface Roughness,
Chemical Composition, and GMR Behavior of NiO and a-Fe2O3 bottom
spin-valves", Seongtae Bae, P. J. Chen, W. F. Egelhoff, Jr., and Jack H.
Judy submitted to IEEE Trans. Magn.
165. "Magnetoelectronic
characteristics of a GMR transpinnor and a magnetic random access memory using
a closed-flux NiFe/Cu/CoFe/Cu/NiFe pseudo spin-valve", Seongtae Bae, P. J.
Chen, W. F. Egelhoff, Jr., Shayne Zurn, Larry Sheppard, Edward J. Torok, and
Jack H. Judy J. Appl. Phys. 91 8414 (2002).
166. "Structural Origin of Large Uniaxial Anisotropy Pinning
Fields Induced by Obliquely Sputtered Underlayers," R. D. McMichael, J. E. Bonevich, P. J. Chen, W. F.
Egelhoff, Jr., and G. C. Lee, J. Appl. Phys., in press.
167.
"Structural, Magnetic, and Thermal Stability of IrMn Exchange Biased
Layers," C. G. Lee, J G. Jung, R.D.
McMichael, R. A. Fry, A. Chen, W.F. Egelhoff, Jr., and V.S. Gornakov, J. Appl.
Phys. 91, 8566 (2002).
168.
" Superconformal Electrodeposition of Silver in Submicron Features,"
T. P. Moffat, B. Baker, D. Wheeler, J. E. Bonavich, M. Edelstein, D. R. Kelly,
L. Gan, G. R. Stafford, P. J. Chen, W. F. Egelhoff, Jr., and D. Josell., J.
Electrochem. Soc. 149 C423 (2002).
169.
" Structural Effects in the Growth of Giant Magnetoresistance (GMR) Spin
Valves," M. Menyhard, G. Zsolt, P. J. Chen, C. J. Powell, R. D. McMichael,
and W. F. Egelhoff, Jr., Appl. Surf. Sci. 180, 315 (2001).
170.
" Ferromagnetic Resonance Mode Interactions in Periodically Perturbed
Films," R. D. McMichael, D. J. Twisselmann, J. E. Bonavich, P. J. Chen, W.
F. Egelhoff, Jr., and S. E. Russek, J. Appl. Phys. 91, 8647 (2002).
171.
"Spin Polarization of Injected Electrons,”
W. F. Egelhoff, Jr, M. J. Stiles, D. L. Pappas, D. T. Pierce, J. M.
Byers, M. E. Johnson and B. T. Jonker, S. F. Alvarado, J. F. Gregg, J. A. C.
Bland, and R. A. Buhrman, Science 296, 1195a (2002).
172.
“Magnetoelectronic
devices using alpha-Fe2O3 bottom GMR spin-valves" S. Bae, S. Zurn, W. F. Egelhoff, Jr., P. J.
Chen, E. J. Torok, R. Spitzer, and J. H. Judy, IEEE Trans. Mag. 37, 1986
(2001).
173.
"Fabrication and Thermal-Chemical Stability of Magnetoresistive
Random-Access Memory Cells Using a-Fe2O3 Bottom Spin Valves," S. Bae, S.
Zum, P. J. Chen, W. F. Egelhoff, Jr., L. Sheppard, E. J. Torok, and J. H. Judy,
IEEE Trans. Mag. 37, 3960 (2001).
174. "Transpinnor: A New Giant Magnetoresistive
Spin-Valve Device," E. J. Torok, S.
Zurn, S. Bae,, P. J. Chen, W. F. Egelhoff Jr., L. E.
Sheppard, R. Spitzer, and J. H. Judy, IEEE Trans. Mag., submitted.
175.
"Three-layer model for exchange anisotropy," S.M. Rezende, A.
Azevedo, and F.M. de Aguiar, J. R. Fermin, W. F. Egelhoff, Jr., and S.S.P.
Parkin, Phys. Rev. B.66, 064109 (2002).
176. "Improved Interfaces and Magnetic
Properties in Spin Valves Using a Ni80Fe20 Seed Layer, " E. J. Repetski,
D. X. Yang, H. D. Chopra, P. J. Chen, and W. F. Egelhoff, Jr., J. Appl. Phys.
91, 3891 (2002).
177.
"Anomalous Switching of Antiparallel Coupled Co Layers Separated by a
Superthin Ru Spacer," V.S. Gornakov, V.I.
Nikitenko, R.D. McMichael, W.F. Egelhoff, Jr., A.J. Shapiro, and R. D. Shull,
J. Appl. Phys. 91, 8272 (2002).
178.
"Pb-Ag as a mixture-surfactant in atomic engineering of spin valves",
Harsh Deep Chopra, D. X. Yang, P. J. Chen, and W. F. Egelhoff, Jr. in
preparation, J. Appl. Phys.
179. "Wedge-Shaped Absorbing Samples Look
Left Handed: The Problem of Interpreting Negative Refraction, and It’s Solution.," M. Sanz, A. Papageorgopoulos, W.F. Egelhoff, Jr., M. Nieto-Vesperinas,
and N. Garcia, . Rev. E 67 Art. No. 067601 (2003).
180. "Ultrafast
Pump-Probe Laser Spectroscopy of the Half-Metal CrO2," H. Huang, K. Seu,
W. F. Egelhoff, Jr., and A. Reilly, submitted to J. Appl. Phys.
181. “Determination
of Interdiffusion Lengths within Sputtered Aluminium-Transition Metal
Bilayers”, J.D.R. Buchanan, T.P.A.Hase, B.K.Tanner, P.J. Chen, L. Gan, C. J.
Powell and W.F. Egelhoff, Jr., Phys. Rev. B, in press.
182. Effects of annealing on the gmr and domain structure stabilization
in a py/cu/py/mnir spin valve. C.-G. Lee, J.-G.
Jung, V.S. Gornakov, R. D. McMichael, A.
Chen, and W. F. Egelhoff, Jr.. Mag. Mag. Mat. 272, 1887 (2004).
183. “Dependence of physical properties and giant
magnetoresistance ratio on substrate position during rf sputtering of NiO and
alpha-Fe2O3 for bottom spin valves,” S. Bae J. H. Judy, P. J. Chen,
W. F. Egelhoff, Jr., Appl. Phys. Lett.81,
2208 (2002).
185. Universal Behavior
of Ballistic Magnetoresistance versus Scaled Conductance in Atomic
Nanocontacts,” S. H. Chung, N. Garcia,
W. F. Egelhoff, Jr., and R. D. Gomez, Phys. Rev. Lett. 89,
287203 (2002).
186. “Anomalously
large intermixing in aluminum-transition-metal bilayers,”J.D.R.
Buchanan, T.P.A. Hase, B.K.Tanner, P.J. Chen, L. Gan, C. J. Powell and W. F.
Egelhoff, Jr., Phys. Rev. B 66
art. no. 104427 (2002)
187. Thin Al, Au, Cu, Ni, Fe and Ta Films as Oxidation
Barriers for the Co in
Air, L. Gan, R. D. Gomez, C. J. Powell, R. D.
McMichael, P. J. Chen,
and W. F. Egelhoff, Jr., Journal of
Applied Physics 93, 8731 (2003).
188. “Ultra-thin Aluminum Oxide as a Thermal
Oxidation Barrier on Metal Films,” L. Gan, R. D. Gomez, A. Castillo, P. J.
Chen, C. J. Powell,, and W. F. Egelhoff, Jr., Thin Solid Films 415, 219 (2002).
189. “Three-layer model for exchange anisotropy,”
S.M. Rezende, A. Azevedo, and F.M. de Aguiar, J. R. Fermin, W. F. Egelhoff,
Jr., and S.S.P. Parkin,Phys. Rev. B.66, 064109 (2002).
190.
“Ru spacer
thickness dependences of the domain nucleation and growth in Co/Ru/Co synthetic
antiferromagnet” V. S. Gornakov, V. I. Nikitenko, W. F. Egelhoff, Jr., R. D. McMichael, A. J. Shapiro, R. D. Shull, J.
Mag. Mag. Mat. 258, 345 (2003).
191. “Dependence of physical properties and giant
magnetoresistance ratio on substrate position during rf sputtering of NiO and
alpha-Fe2O3 for bottom spin valves,” S. Bae J. H. Judy, P. J. Chen,
W. F. Egelhoff, Jr., Appl. Phys. Lett.81,
2208 (2002).
192.
“Co Layer Thickness Dependence of Exchange Biasing of IrMn/Co and FeMn/Co,” K.
Seu, H. Huang, J. L Showman, H. Showman, W. F. Egelhoff, Jr. and A. Reilly, J.
Appl. Phys. 93, 6611 (2003).
193.
“Universal Scaling of Magnetoconductance in Magnetic Nanocontacts,” S. H.
Chung, N. Garcia, W. F. Egelhoff, Jr., and R. D. Gomez, J. Appl. Phys. 93, 7939
(2003).
194. v “Intermixing of
Aluminium-Magnetic Transition Metal Bilayers,”_ J.D.R. Buchanan, T.P.A.Hase,
B.K.Tanner, P.J. Chen, L. Gan, C. J. Powell and W.F. Egelhoff, Jr., submitted
to J. Appl. Phys. 93, 8044 (2003).
195.
“Magnetoresistance magnetometry of (Ni80Fe20) 1-xIrx
wires with varying anisotropic magnetoresistance ratio,” C.A.F. Vaz, E. Blackburn, M. Klaui, J.A. C.
Bland, W. F. Egelhoff, Jr., E. Cambril, G. Faini, and W. Wernsdorfer, J. Appl.
Phys. 93, 8104 (2003).
196. “Highly Deleterious Role of Small Amounts of
Carbon in the Giant Magnetoresistance Effect,” D. X. Yang, E. J. Repetski, H.
D. Chopra, P. J. Chen, and W. F. Egelhoff, Jr., J. Appl. Phys. 93, 8415 (2003).
197. “Thin Al, Au, Cu,
Ni, Ta, and Fe Films as Oxidation Barriers for the Co Surface in Air,” L. Gan,
R. D. Gomez, C. J. Powell, R. D.
McMichael, P.
J. Chen, and W. F. Egelhoff, Jr., J. Appl. Phys. 93, 8731 (2003).
198.
“Magnetization Reversal in Epitaxial CrO2 Films,” I. L. Siu, W. F. Egelhoff, Jr., H. D. Chopra, and D. X. Wang, J. Appl.
Phys., 92, 5409 (2002).
199.
“Absence of Ballistic Magnetoresistance (BMR) in Electrodeposited Ni
Nanocontacts using Feedback control used to select the contact resistance,” Jonathan J. Mallett Erik B. Svedberg, Hanania Ettedgui, Thomas P.
Moffat and W. F. Egelhoff, Jr., Appl. Phys. Rev., B 70, art. no.
172406 (2004)
200. Analysis
of Point-contact Andreev Reflection Spectra in Spin Polarization Measurements,”
G.T. Woods, R, J. Soulen Jr., I. I. Mazin., B. Nadgorny,
M. S. Osofsky, J. Sanders, H. Srikanth, W. F. Egelhoff, Jr., and R. Datla
, Phys. Rev. B submitted
201. “Resistance
changes similar to ballistic magnetoresistance in electrodeposited
nanocontacts,” Erik B. Svedberg,
Jonathan J. Mallett, Hanania Ettedgui, Li Gan, P. J. Chen, Alexander J.
Shapiro, Tom P. Moffat and W. F. Egelhoff, Jr., Appl. Phys. Lett. 84, 236 (2004).
202. “Influence of interface
alloying on the magnetic properties of Co/Pd multilayers”J. Carrey and A. E. Berkowitz, W. F. Egelhoff, Jr., D. Smith, Appl.
Phys. Lett. 83, 5259 (2003)
203. “Artifacts in Ballistic
Magnetoresistance Measurements,” W. F. Egelhoff, Jr., L. Gan, H. Ettedgui, Y.
Kadmon, C. J. Powell, P. J. Chen, A. J. Shapiro, R. D. McMichael, J. J.
Mallett, T. P. Moffat, M. D. Stiles, and E. B. Svedberg J.Appl. Phys. 95, 7554 (2004).
204.
“Mixed Surfactants as a Novel Approach to Atomic Engineering of Spin Valves.”
D. X. Yang, H. D. Chopra, P. J. Chen, and W. F. Egelhoff, Jr., IEEE Trans. Mag.
submitted
205.
“Compositional Control in Electrodeposition of FePt Films,” J.J. Mallett , E. B. Svedberg,
S. Sayan, A. J. Shapiro, L. Wielunski,
T.E. Madey, W. F. Egelhoff, Jr. and T. P. Moffat, Electrochemical and Solid-State Letters 7,
C121 (2004).
206. Compositional
Control in Electrodeposition of CoPt
Films J.J. Mallett , E.
B. Svedberg, S. Sayan, A. J. Shapiro, L. Wielunskic), T.E. Madey, P. J. Chen, W. F. Egelhoff, Jr.
and T. P. Moffat, Electrochemical and Solid-State Letters, 8 (1) C15 (2005).
207.
“Recrystallization Texture and Magnetic Properties of Electrodeposited FePt on
Cu(001)”, E. B. Svedberg, J.J. Mallett,
S. Sayan, A. J. Shapiro, W. F. Egelhoff, Jr., and T. P. Moffat,
Appl. Phys. Lett. 85, 1353 (2004)
208.
“Artifacts that Could be Misinterpreted as Ballistic Magnetoresistance,” W. F.
Egelhoff, Jr., L. Gan, E. B. Svedberg, C. J. Powell, A. J. Shapiro, R. D.
McMichael, J.J. Mallett, T. P. Moffat, and M. D. Stiles, PMRC’04
Conf. Digests, in press.
209.
“A Comparison of the Magnetic Characteristics of Nanocrystalline Ni, Zn, and Mn
Ferrites Synthesized by Reverse Micelle Technique,” R.D.K. Misra, S. Gubbala,
A. Kale, and W.F. Egelhoff, Jr., Mat. Sci. & Eng., B 111,
164 (2004).
210.
“Artifacts that Mimic Ballistic Magnetoresistance,” W. F. Egelhoff, Jr., L.
Gan, H. Ettedgui, Y. Kadmon, C. J. Powell, P. J. Chen, A. J. Shapiro, R. D. McMichael, J. J. Mallett, T. P. Moffat,
M. D. Stiles, and E. B. Svedberg, J. Mag. Mag. Mat., in press
211.
“Perpendicular
Anisotropy in Co/Pd Multilayers”, J. I. Hong, S. Sankar, and A. E. Berkowitz, W. F. Egelhoff, Jr. submitted to JMMM
212.
“Interface Intermixing and In-plane Grain Size in Aluminium-Transition Metal
Bilayers,” J.D.R. Buchanan, T.P.A.Hase, B.K.Tanner, C. J. Powell, and W.F. Egelhoff,
Jr., Phys. Rev
213.
“Surface anisotropy of permalloy in NM/NiFe/NM multilayers,” J. O.
Ranchler, P. Chen, R. D. McMichael, W. F. Egelhoff, Jr., B. B.
Maranville, A. S. Aarott, S. K. Satija, and J. A. Borchers, submitted to J.
Appl. Phys
214. “Origin of Novel Effects in High-Coercivity
Air-Annealed CoPd Multilayers,” W. F. Egelhoff, Jr., R. D. McMichael, J. J.
Mallett, A. J. Shapiro, C. J. Powell, and J. E. Bonevich, J. H. Judy, J. H.
Thomas, and E. B. Svedberg, J. Appl. Phys. submitted
215.
“Upper Critical Magnetic Field of a Superconductor as a function of Disorder,”
R, J. Soulen Jr., I. I. Mazin., B. Nadgorny,
M. S. Osofsky, J. Sanders, H. Srikanth, W. F. Egelhoff, Jr., and R. Datla
, Phys. Rev. B submitted
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