Measurement Issues in Single Wall Carbon Nanotubes 

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GENERAL INFORMATION

This invitation-only workshop on Measurement Issues in Single Wall Carbon Nanotubes brought together leaders in the carbon nanotube community to jointly discuss key measurement challenges associated with these unique nanomaterials.   Our focus was purity and dispersion characterization, two critical areas that cross manufacturing, R&D, and product development. 

To ensure inclusion of a wide range of viewpoints, participation from industry, government, and academic researchers was solicited.  The workshop results will be used to produce a series of “Recommended Practice Guides” on nanotube characterization.  We anticipate that the development of these written protocols will enable product developers to more rapidly assess as-received materials, prepare the best nanotube dispersions for their applications, and ultimately achieve good repeatability and high performance in their final value-added products.

NIST and NASA jointly feel that this workshop, and its subsequent output, will have broad applicability to the nanotube community.  To ensure that we achieve our goals, we have solicited input from noted researchers (see Scientific Advisory Committee – ) as well as previous participants from the 2003 meeting (see Background/Workshop I ). 

For more details on the workshop format, please select from the many options to your left

Organizing Committee:

NASA

Sivaram Arepalli, NASA-JSC, (281) 483-5910;  s.arepalli@jsc.nasa.gov

Leonard Yowell, NASA-JSC, (281) 483-2811;  leonard.yowell-1@nasa.gov

Pasha Nikolaev, NASA-JSC, (281) 483-5946;  pasha.nikolaev1@jsc.nasa.gov

Cheol Park, NIA/NASA-Langley, (757) 864-8360; c.park@larc.nasa.gov

NIST

Stephen Freiman, NIST, MSEL, Gaithersburg, MD (301)975-5658 sfreiman@nist.gov

Stephanie Hooker, NIST, MSEL, Boulder, CO (303) 497-4326 shooker@boulder.nist.gov

Kalman Migler, NIST, MSEL, Gaithersburg, MD (301) 975-4876 kmigler@nist.gov

Richard Cavanagh, NIST, CSTL, Gaithersburg, MD (301) 975-2368 rcavanagh@nist.gov

Scientific Advisory Committee:

Rick Smalley, Rice University

Ken Smith, Carbon Nanotechnologies, Inc.

Seigmar Roth, Max-Planck Inst., Germany

Jack Fischer, University of Pennsylvania

Phaedon Avouris, IBM

Millie Dresselhaus, MIT